Used JEOL JSM 6510LV #293629371 for sale

JEOL JSM 6510LV is a Variable Pressure Scanning Electron Microscope (VP-SEM) that offers superior sample imaging with high resolution and superior depth of field. The objective lens of the instrument is designed for use with a wide range of electron energies for imaging at different magnifications. This enables images to be taken at a variety of depths and resolutions. JSM 6510LV is equipped with a 20 kV to 200 kV ultra-high energy electron gun, an extensive range of in-column filter and gun control options, and a unique combination of column tilt and rotation to allow precise sample alignment and maximum imaging quality. The integrated environmental scanning electron detector (ESED) provides superior performance in combination with the highest sensitivity operating conditions. This allows the user to achieve the best combination of particle resolution and sensitivity. JEOL JSM 6510LV also offers several imaging modes, including secondary electron imaging, dark field imaging and energy-filtered backscatter imaging. This allows the user to image surfaces at different angles and depths, without the need for sample preparation or coating. JSM 6510LV features an impressive array of features, including sample and partial vacuum stages, a sample chamber with differential pumping capability, and the ability to image samples as large as 54 mm in diameter. In addition, the instrument also has an optional autofocusing system, which allows for precise focus control and sample imaging. JEOL JSM 6510LV offers an advanced array of control features, such as an autotilt tool, a particle filter with adjustable parameters, and a map filter. The instrument also provides the user with access to a range of imaging software tools, including advanced particle analysis, image comparison, and report generation. JSM 6510LV is an ideal instrument for a wide range of applications, including imaging of nanomaterials, semiconductor manufacturing, biotechnology research and forensics. It offers superior images, versatile imaging capabilities and is easy to use and maintain. All these features make JEOL JSM 6510LV a superior scanning electron microscope.