Used JEOL JSM 6510LV #293661215 for sale
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ID: 293661215
Vintage: 2010
Scanning Electron Microscope (SEM)
Resolutions:
3.0 nm at 30 kV
8 nm at 3 kV
15 nm at 1kV
LV Mode: 4.0 nm at 30 kV
LV Pressure: 10 to 270 Pa
Magnification: 5x to 300,000x
Image mode: REF Image, Composition, Topography, Shadowed, Secondary electron image
Accelerating voltage: 0.5 kV-30 kV
Pre-centered filament
Electron gun: Fully automated, Manual override
Zoom condenser lens
Conical objective lens
Electrical image shift: 50 µm at 10mm
Ethernet
Pumping system
Auto functions:
Focus
Brightness
Contrast
Stigmator
Specimen stage:
X: 80 mm
Y: 40 mm
Z: 5 mm to 48 mm
Tilt: −10° to 90°
Rotation: 360°
Operating system: Windows 7
PC: IBM PC/AT
2010 vintage.
JEOL JSM 6510LV is a type of scanning electron microscope (SEM). The SEM adopts the latest technology to provide superior performance, greater ease of use and broader capability. This device is designed to offer users nanometer imaging capabilities necessary for observing nanoscale features of a specimen. This microscope features a variable pressure working chamber, allowing observation under low-vacuum (down to 0.3 Pa) or atmospheric conditions and providing freedom from sample preparation. Its newly adopted Schottky field emission electron source and gas field emission gun enable high-resolution imaging with a minimum of sample preparation. JSM 6510LV also includes an energy dispersive X-ray detector that allows the user to measure semiconductor structures and other tiny components. The spectrometer is also capable of making qualitative and quantitative evaluations of each element in the sample. The microscope's user-friendly design allows a wide range of applications. A direct input window allows the user to input parameters of the image acquisition process, while the one-touch button provides a simple yet efficient workflow. The microscope also features a computer control system that allows the user to set various parameters without the need of manual input. JEOL JSM 6510LV comes equipped with an advanced digital camera system. Images can be stored as 16 bit grayscale or color JPEG files. This microscope can also be used for automatic image transfer with a USB or Ethernet cable. For improved microscope performance, JSM 6510LV comes with an alpha-ray detector with adjustable image contrast, a stage-vibration compensation system with motorized X-Y-Z stages for operating ease, and a motorized focusing mechanism for accurate specimen imaging. This highly-advanced microscope is an ideal choice for researchers seeking an advanced SEM. Its latest technology and features make it an ideal choice for a wide range of applications including but not limited to nanoscale imaging, semiconductor structures, micro-element analysis and other fields of research.
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