Used JEOL JSM 6510LV #293671225 for sale

JEOL JSM 6510LV is a world-class scanning electron microscope (SEM) that supports powerful imaging and analysis capabilities. It uses an energy dispersive spectrometry (EDS) equipment to deliver superior performance in imaging and microanalytical measurements. The system offers high resolution images in both the high-vacuum and low-vacuum modes. The microscope is equipped with an ultra-high vacuum chamber that can reach levels of better than 5×10-6 Torr. This level of vacuum drastically improves the contrast resolution and image details when using a high-vacuum mode. The low-vacuum mode uses an environmentally-friendly neutral gas to reduce beam current. The EDS unit is comprised of a lap-mounted search coil that extends up to 8mm. It features ultra-high resolution measurement down to 0.02% absolute for a single pixel. JSM 6510LV features an advanced variable-pressure imaging machine. This feature allows the scan pressure to be adjusted automatically for optimal imaging down to 5.10-3 Torr. The microscope also utilizes a high-res Backscatter Detector (BSD) to accurately measure samples with a high Z-contrast. The BSD utilizes a four-element boron-oxide filter which produces quality images by reducing noise levels. Additionally, the PAIS (Patterned Analysis and Imaging Tool) provides state-of-the-art imaging and microanalysis through the application of classification patterns. JEOL JSM 6510LV is also designed to minimize maintenance costs. It features a material-saving O-ring asset that prevents contamination and reduces the need for frequent cleaning. The integrated Environmental Control Model (ECS) ensures that the microscope is operating with optimal conditions for optimal performances. A computer-controlled cooling equipment maintains the noise level, allowing for low levels of vibration and temperature control. Finally, a built-in Database Server helps to manage the settings and parameters of the microscope for easy access. Overall, JSM 6510LV is an advanced SEM that produces superior results in both the high-vacuum and low-vacuum modes. It is well-suited for researchers who need clear and detailed images as well as high-resolution microanalytical measurements. Additionally, the maintenance-friendly design helps to cut costs while ensuring optimum performance.