Used JEOL JSM 6510LV #9363436 for sale

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ID: 9363436
Scanning Electron Microscope (SEM) Chamber, 6" Stage, 5" Tungsten SEM High and low vacuum modes of operation SE and BSE Imaging detectors IR-Chamber scope Vacuum pump Computer control.
JEOL JSM 6510LV is a high-end scanning electron microscope used by scientists to observe a variety of biological and non-biological materials. It uses a beam of electrons instead of light to form images of high resolution and depth of field. JSM 6510LV is equipped with a LaB6 electron source which is optimized for operation at high acceleration voltages. It offers a variety of imaging modes such as secondary electron, primary electron, backscatter electron, and incoherent side scatter imaging. The high resolution images are captured with a maximum magnification of 200,000x. Additionally, JEOL JSM 6510LV can capture in-plane and out-of-plane tilt images as well as 3D tomographic images. JSM 6510LV is highly automated to enable users to efficiently capture the images without having to adjust the settings. The advanced image acquisition software, FEG-AQUA, simplifies analysis and interpretation of the resulting image data. The microscope comes with a high-sensitivity camera, which enhances the user's ability to capture images with great precision. A unique feature of JEOL JSM 6510LV is its ability to capture images in vacuum conditions, allowing investigations on samples which would be destroyed by other imaging techniques. This advanced level of imaging allows users to detect extremely small morphological features not visible with light microscopy. JSM 6510LV is a well-balanced instrument for scientific research and can be used for a broad range of applications including forensic and medical research, material sciences, electronics and failure analysis, semiconductor manufacturing, and nanotechnology. This makes it essential for manufacturers seeking to improve their products and processes.
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