Used JEOL JSM 6600 #177690 for sale
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ID: 177690
Scanning Electron Microscope (SEM), 6"
Electromagnetic
Double-deflection
Lens system:
Condenser lens
Objective lens
Specimen movement range:
X-Direction: 160 mm
Y-Direction: 160 mm
Z-Direction: 31 mm
Tilt: 0° - 600°
Rotation (ESR Unit): 360° Endless
Objective apertures: 50, 70, 110, 170 µm In diameter
EDX Option
Magnification: 10x - 300,000x
Secondary electron image resolution (At 8 mm working distance):
35 kV 3.5 nm
1 kV 20.0 nm (Attainable)
Accelerating voltage:
0.2 to 40 kV (0.2 to 5 kV Variable in 0.1 kV steps, 5 to 40 kV variable in 1 kV steps)
Power: 200 VAC, Single phase, 30 A, 50/60 Hz, 6 kVA
1990 vintage.
JEOL JSM 6600 Scanning Electron Microscope (SEM) is a powerful and versatile instrument that can be used for a variety of materials and applications. This microscope is equipped with an energy-dispersive X-ray analyzer and an electron gun that provides superior performance in imaging, chemical analysis, and other applications. The system employs the latest generation of field emission cathodes that allow the specimen to be scanned quickly and accurately. This technology ensures exceptional image resolution while still allowing high magnification up to 30,000x. The instrument also features a detector that has a large depth of field and high sensitivity to detect a wide range of elements present in the sample. The SEM is equipped with a motorized scanning stage and a software package for operators to customize their settings for a given specimen. This includes settings for stage speed, time control for sequential scans, magnification settings, and adjustments for electron beam current and accelerating voltage. JEOL JSM-6600 is also equipped with an automated backscattered electron detector for use in images of non-conductive materials. This instrument utilizes a computer-driven scan algorithm to track fine details of the elemental distribution in the sample. Additionally, JSM 6600 features advanced features such as annular dark-field imaging, cathodoluminescence imaging, and a particle probe detector to detect particles in the sample. This instrument can also be used to create three-dimensional images of the sample. The system is also able to be used in conjunction with other instruments to achieve a more comprehensive analysis. This includes the use of scanning transmission electron microscopy, electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, and low energy electron diffraction. JSM-6600 is a versatile scanning electron microscope that is capable of providing superior image resolution as well as chemical analysis of samples. This high-performance instrument is a great choice for advanced materials analysis applications.
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