Used JEOL JSM 6600FXV #9098215 for sale
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ID: 9098215
Scanning Electron Microscope (SEM)
Part number: D39562000
Imaging and control system
Manuals included
Power: 200 VAC, 30 A, Single phase, 6 kVA.
JEOL JSM 6600FXV is a scanning electron microscope (SEM) that is designed for high-resolution imaging and analysis of materials. It is a top-of-the-line tool, optimized for performance within electron beam microscopy. This microscope operates using a field emission electron gun with an integrated conventional magnetic objective lens equipment. Additionally, JSM 6600FXV features a solid-state EDX detector system for on-axis energy dispersive X-ray spectroscopy (EDX) and a high-sensitivity digital signal processor for capturing low noise imaging. The SEM is composed of an ultra-high vacuum environment with a controllable acceleration voltage range of 0.5 to 30kV and a highly sensitive high-resolution display unit. It has a sample chamber with an X, Y, Z sample drive unit and a sample-holder for specimen positioning and tilt adjustment capabilities. Its sample holders can accommodate samples with dimensions up to 220 x 200mm. The microscope also features an advanced image proccessing machine, allowing for flexibility for data collecting and processing. JEOL JSM 6600FXV is equipped with a wealth of analytical features, including an electron beam-induced current (EBIC) tool, EDX capabilities for elemental analysis, and a chemical map function that can be used to characterize materials on the microscopic scale. The EBIC asset allows researchers to detect and measure the local electrical type and current in a specimen. EDX enables the user to achieve high-sensitivity chemical analysis of the sample surface and the chemical map function enables users to analyze the spatial distribution of elements within a sample. The ability to image samples in a range of conditions from high vacuum to high pressure gas, as well as in scanning liquid cell mode, makes JSM 6600FXV a versatile instrument. Furthermore, JEOL JSM 6600FXV's advanced electron gun allows for operation in analytical conditions, meaning results and images generated with this microscope are of the highest quality. JSM 6600FXV is an advanced scanning electron microscope, optimized for high resolution imaging and analysis of materials. It offers a range of features such as field emission electron gun, EDX detector model, image processing equipment, EBIC system, and more, making it an invaluable tool for material characterization.
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