Used JEOL JSM 6610LA #293758763 for sale

JEOL JSM 6610LA scanning electron microscope (SEM) is a high performance analytical tool designed for scientific research in a range of sub-disciplines from materials science to life sciences. JSM 6610LA is capable of magnifying the surface of samples up to 900,000 times and acquiring images in a variety of ways. It is capable of producing 3D optical tomograms, surface movies, cathodoluminescence, secondary electron, and backscattered electron images. JEOL JSM 6610LA features a high vacuum environment with a small chamber. This environment ensures that the electron beam can penetrate the sample more deeply without contamination. Its electron dynamical column features a cold cathode type electron emitter and an electrostatic lens equipment that allow it to conduct high-resolution imaging at a relatively low current. It is also designed with an energy-filtering system, enabling the user to control the energy of electrons transmitted to the sample. This ensures that the electrons interact with the sample in the exact way desired by the user. The unit's large chamber enables the user to measure samples up to 120x120mm and 480x480mm depending on the state of the sample. It has a maximum sample size of 10x10mm, which allows the user to quickly scan large samples. JSM 6610LA also comes with a variety of user-friendly features, such as an image processing package, which allows the user to manipulate the acquired images in an intuitive manner. In terms of analytical capabilities, JEOL JSM 6610LA is equipped with an EDS (Energy Dispersive Spectroscopy) machine, which can be used to acquire X-ray signals and identify elements in the sample. The tool also produces elemental maps, which show the distribution of elements in the sample. The EDS asset can be used to measure the chemical composition of a sample as well as its bulk composition. JSM 6610LA also includes a laser secondary ion mass spectrometry (SIMS) model, which is used to analyze the surface of a sample. The equipment can be used to detect the presence of atoms such as hydrogen, oxygen and nitrogen on the sample. The SIMS system can also be used to measure the concentration of metal atoms present on the surface and in the bulk of the sample. Overall, JEOL JSM 6610LA is a sophisticated scanning electron microscope with a range of capabilities. It is very versatile and provides users with an array of features. It can be used to acquire high-resolution images of a sample or to analyze its surface and bulk composition. The unit is reliable, intuitive and easy to use.