Used JEOL JSM 6610LA #9410816 for sale

JEOL JSM 6610LA is a scanning electron microscope (SEM) designed to provide high-resolution images of a sample's surface with ultra-high magnification power. It is equipped with an energy dispersion X-ray analysis system (EDX) that can analyze sample elements at a cellular resolution. This system is useful for examining the structure of materials, the chemistry of a sample's surface, and the intimate nature of the specimen's composition. The microscope has a magnification power of up to x50,000 and a minimum resolution of 0.8 nm. It uses a tungsten filament electron source, providing electrons over a wide energy range. The condenser lens uses variable-intensity astigmatism to better focus the beam without causing distortion to the specimen at high magnifications. The design also features an aperture angle stop to provide a variable pole height for controlling the size of the electron beam. The specimen stage can be moved using an X-Y-Z drive mechanism that enables the sample to be pushed and pulled to move relative to the electron beam. The stage can accommodate samples of up to 390mm×305mm and is tiltable up to ± 50°. An auto stage is also featured to allow automated scanning. JSM 6610LA has a charge compensator to reduce the effect of electrostatic forces that can distort sample images. This is especially useful when imaging non-conducting samples such as plastics. The SEM software is designed to provide digital images and data with high accuracy. It can store operation parameters and results for future reference. It is also capable of data analysis and can be used to detect changes in sample elements over time. JEOL JSM 6610LA provides users with imaging performance for research and industrial fields. Its high-resolution imaging capabilities, flexible stage drive mechanisms, and powerful data analysis software make it a valuable imaging tool.