Used JEOL JSM 6610LV #9410899 for sale

JEOL JSM 6610LV is a scanning electron microscope (SEM) with advanced capabilities for imaging and analysis. The 6610LV is a high-performance SEM capable of producing high-resolution images with a resolution down to 1.3 nanometres. It is equipped with a large chamber and is suitable for analysis of large and thick samples with a maximum sample size of up to 200mm diameter. The 6610LV offers a wide range of features such as high-precision scanning, high degree of automation, an easy-to-use operating system, and a high level of flexibility. The inverted design of the SEM allows for enlarged working area, larger sample size and higher vacuum level compared to other SEMs. The 6610LV also supports a wide range of detectors namely secondary electron (SE-1), backscattered electron (BSE), energy dispersive spectroscopy (EDS), and others. The high-performance scanning electron microscope, JEOL JSM 6610 LV is capable of achieving high-resolution imaging and analysis. It supports superior analysis and observation capabilities and is suitable for a variety of users who require both high-resolution imaging and analysis capabilities. With its extended working area and large chamber size, JSM 6610LV supports a wide range of sample sizes and applications. In addition, the SEM is highly automated and simple to operate. As such, the 6610LV is an ideal tool to conduct both imaging and analytical materials research.