Used JEOL JSM 6700F #293598389 for sale

ID: 293598389
Field Emission Scanning Electron Microscope (FE-SEM) Specimen holder: Range: X-Direction: 0 - 70 mm Y-Direction: 0 - 50 mm Z-Direction: 1.5 - 25 mm Tilt: 5 - 60 Rotation: 360° Resolution: 1.0 nm at 15 kV 2.2 nm at 1 kV Magnification: 25x - 650,000x Power supply: 0.5 - 30 kV.
JEOL JSM 6700F is a scanning electron microscope (SEM) designed for research and development applications in industries associated with materials, biomolecules, and other nanomaterials. This high-resolution microscope operates on secondary electrons generated from a primary electron beam and is equipped with a field emission gun that helps improves the resolution and accuracy of SEM images. Using a technique called field-emission scanning electron microscopy (FE-SEM), JEOL JSM 6700 F provides a highly coherent and low energy electron beam capable of resolving features down to the sub-nanometer range. JSM 6700F utilizes a pole-piece type electrostatic lens and a series of condenser lenses to focus the electron beam, giving the instrument unprecedented levels of accuracy and precision. Advanced features, such as digital signal processors (DSPs) it features, help to reduce unwanted scattering and produce clear images with enhanced stability. JSM 6700 F also has the capability to scan in three dimensions using its advanced stage, enabling the user to find deeper layers of samples and gain better insight into the internal structures of materials. This makes it perfect for applications such as imaging cells, tissue research, and nanomaterials. JEOL JSM 6700F's Secondary Electron Detector (SED) is also capable of producing high quality images. This technology works with a backscattered electron (BSE) detector to analyze and image regions with a high electron scattering angle, allowing for the construction of three-dimensional images of samples. This high-precision detector also has the added benefit of producing much higher image resolution compared to other SEMs. JEOL JSM 6700 F is a powerful too that offers users a wide range of features, including live microscope display, autofocus, pressure-regulated imaging, enhanced air shielding, and low optical aberration correction. This instrument can be used in virtually any industrial setting, such as in semiconductors, aerospace, and biomedicine, and is highly recommended for research and/or development applications.
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