Used JEOL JSM 6700F #293600930 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) designed to provide detailed images of the surface of a sample. It features extraordinary resolving power, a high degree of accuracy, and the ability to perform a wide range of analytical techniques. The instrument has a variable pressure chamger that works to keep the interior atmosphere at a low vacuum, enabling the user to carry out SE imaging and EDX analysis that are independent of the sample's conductive properties or features. By utilizing the secondary electrons and backscattered electrons generated by an incident electron beam upon a sample, JEOL JSM 6700 F enables the user to obtain high-resolution imaging and quantitative micro-analysis of non-conductive samples. JSM 6700F is equipped with an auto-focus feature that adjusts the focus of the sample to provide optimum imaging conditions. Its gun and objective lens design provide excellent analytical performance, particularly when combined with its widened energy range of the energy dispersive X-ray equipment. By utilizing the energy dispersive X-ray (EDX) system, JSM 6700 F is capable of providing elemental sensitivity down to a few hundred parts per million (p.p.m.). The SEM incorporates a modern digital camera that uses a slowscan and high speed image recording of motion sample imaging, enabling it to provide superior resolution images and display clear and sharp details of the sample's microstructure. The length of the recording time can be adjusted, further enabling imaging of samples that possess dynamic features or those that may take extended periods of time before they reach steady-state. The user-friendly software of JEOL JSM 6700F facilitates convenient operation of the instrument. It includes a drawing unit for reconstructing the three-dimensional shape of the scanned samples, a library machine for image management, and Multi-Element Analysis Applications software for quantitative analysis. JEOL JSM 6700 F is an invaluable tool for engineers and scientists who are researching and analyzing sample materials. By providing a detailed and accurate picture of the sample's microstructure, the instrument enables users to make accurate observations and gain insight into the sample material, making it a valuable tool in the study of surface properties, materials science, and nanotechnology applications.