Used JEOL JSM 6700F #293603871 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) that provides high resolution, top-down imaging of a variety of materials and specimens. This equipment is an ideal choice for applications such as microelectronics, materials science, applied research, and biological imaging. JEOL JSM 6700 F uses a cold field emission electron source that produces electrons with a wide range of kinetic energy. This enables the user to select a specific energy to optimize imaging conditions and contrast. The system also uses a high resolution electron optical column that includes a depth of field regulator, chromatic-aberration corrector, stigmators, and condenser lenses. This allows imaging of samples from 50 nanometers to several micrometers. JSM 6700F has a sample chamber that is capable of operation in conventional vacuum, high vacuum, or low-vacuum conditions. The chamber is equipped with an Electron Beam Scanning Unit (EBSS) which allows for highly accurate, high-speed imaging by controlling the sample position within the electron optical column. This eliminates the need for manual alignment of the sample and enables fast acquisition of high quality images. In addition to top-down imaging, JSM 6700 F provides a range of analytical capabilities, including energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), cathodoluminescence (CL), and secondary electron imaging. These tools can provide enhanced contrast and resolution for imaging a variety of materials and embedded features. JEOL JSM 6700F provides excellent image quality and is suitable for imaging a range of materials, from microelectronics to biological specimens. Its advanced features and capabilities make it a top choice for imaging applications that demand the highest resolution and accuracy. The machine is easy to operate and is also equipped with safety features to ensure user safety during operation.