Used JEOL JSM 6700F #293608930 for sale

JEOL JSM 6700F is a field-emission scanning electron microscope (FESEM) that offers extraordinary imaging capabilities thanks to its monochromated electron optical system. It is capable of obtaining high-resolution images with spectacular depth of field. With the high-quality optics and advanced signal processing, JEOL JSM 6700 F achieves excellent spatial resolution, up to 50 nm in operation mode, despite the fact that its acceleration voltage is just 1.2 kV. JSM 6700F uses backscattered electrons (BSE) to capture images of samples with a striking level of detail. The samples can be observed in a wide variety of conditions and preparation techniques, such as dry samples or liquid cells. JSM 6700 F has a dynamic range of more than five orders of magnitude, being capable of detecting even the faintest contrasts between different points of the sample. This allows for a high level of detail in the observations, revealing evidence of morphological and/or compositional variation. JEOL JSM 6700F also has an advanced 4-axis goniometer that provides a highly precise sample manipulation. This allows samples to be analyzed in big detail, especially those with a very small size. The samples can also be analyzed in situ. JEOL JSM 6700 F has a unique combination of features, such as vacuum stages dedicated to in situ observation, allowing analysis at different controlled temperatures and pressures. This makes the instrument useful for experiments such as in-situ tribology, electro-chemical experiments or others undergoing temperature or pressure changes. Thanks to its low acceleration voltage and its variable pressure environment, JSM 6700F is particularly suitable for the study of samples sensitive to electron irradiation, such as organic materials. JSM 6700 F is fitted with a browser mode that presents the observed image on a display screen with a graphical user interface. This display presents an angular view of the observation instead of the standard linear view which allows for a better representation of the sample. JEOL JSM 6700F boasts a highly automatized operation, making it easy to use even for novice users. Both the image acquisition and analytical processes can be automated to save time, allowing users to edit sequences and parameters without rerunning the entire imaging process. In conclusion, JEOL JSM 6700 F is an advanced and sophisticated scanning electron microscope, offering microscopic imaging capabilities at an unprecedented level of detail, ideal for the study of materials, both in situ and ex situ.