Used JEOL JSM 6700F #293636522 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) designed to provide high quality imaging and analysis of a variety of sample types. This SEM offers excellent resolution and high depth of field, enabling magnifications up to 60,000x and an impressive depth of field of at least 20µm. JEOL JSM 6700 F is equipped with a voltage range of 200-30kV and a spot size that can be adjusted from 1-7mm. In addition, this model of SEM has a high duty cycle of active beam running time, allowing for uninterrupted imaging of large samples over extended periods. JSM 6700F features an advanced backscattered scan mode, which allows for reduced artifacts in the imaging process. This mechanism operates on the same principle as a scanner's rastering process, enabling several point sources per horizontal line, achieving superior resolution over rastering techniques. This model of SEM also has built-in digital signal processing, enabling improved signal to noise sensitivity while reducing artifacts in the sample images. JSM 6700 F can also be upgraded to an EDS Microchamber, which offers easy and reliable automated spectrum collection and analysis. The user interface of JEOL JSM 6700F is designed to be intuitive and simple to use, allowing the user to quickly set up and acquire images. This model of SEM is also equipped with a vacuum chamber, enabling analysis of air-sensitive samples without compromising image quality and resolution. Overall, JEOL JSM 6700 F offers superior resolution and depth of field, along with a range of features that enable it to perform high quality imaging and analysis. This model of SEM is capable of operating in a variety of conditions, making it an ideal choice for researchers in the fields of biology, materials science, and engineering.