Used JEOL JSM 6700F #293652431 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) designed to produce high-resolution images of the surface structure of a sample. It is capable of producing high-quality digital images that can be used for detailed analysis or for educational purposes. JEOL JSM 6700 F utilizes a focused electron beam to scan the sample surface to produce secondary electron and backscattered electron images. The primary electron beam is produced using an electron gun, which creates a fine electron emission from a tungsten filament. This beam is then accelerated within an electric field, depending on the desired resolution. The beam is then focused using an electrostatic lens system, allowing for sub-micron resolution imaging. JSM 6700F has a range of features to enhance its performance and analytical capabilities. It comes equipped with dynamic focusing and stigmation for optimized imaging. It also has a probe current control system to maintain image stability, display options for up to three different signals simultaneously, digital image processing, and a post-sputter unit for energy dispersive spectroscopy. JSM 6700 F also provides user-friendly operation. In addition to traditional parameters, the instrument includes functions such as auto-mapping and preset modes. The user can also take advantage of the range of analytical tools, such as hardness mapping, phase identification, and dispersive contrast imaging. The magnified images are produced in monochrome or color, depending on the user-selected mode. The images can be exported as either high- or low-resolution files and shared with other users. With its outstanding performance and comprehensive range of features, JEOL JSM 6700F is an excellent choice for analytical and educational needs.