Used JEOL JSM 6700F #293655231 for sale

JEOL JSM 6700F Scanning Electron Microscope (SEM) is a high-performance instrument for the observation and analysis of a wide variety of samples. It provides superior image quality and resolution due to its fine probe size and long working distance. The 6700F features a cold field emission gun (CFE gun) to produce high-quality images with superior depth of field and excellent resolution with magnifications up to 300,000x. The CFE gun produces low electron beam currents and allows for operation at low voltages which increases the instrument's working distance which can reach up to 100mm. The 6700F also has a large solid state imaging area of 25mm x 25mm and is capable of producing various types of contrast including Backscatter Electron Detector (BED) and In-lens (IL) imaging. Additionally, the 6700F can be equipped with an optional second stage detector which can provide secondary electron imaging in both reflected and transmitted modes. The 59mm sample chamber can hold samples with sizes up to 55mm in diameter. The sample chamber also features automated control and sample exchange with optional accessories such as a load-lock, cryo cooling stage, and cool stage. Furthermore, the 6700F has a superior analytical performance with an optional EDS system designed specifically for the kit. The EDS system can provide elemental analyses of materials and is used to measure light elements such as Carbon, Oxygen and Sulfur. JEOL 6700F is also an automated SEM, equipped with Scanning Probe Image and Analysis (SPIA) and advanced Scanning Auger Microscopy (SAM) capabilities. SPIA provides 3D imaging for nanoscale characterization by combining line scan and imaging modes for larger areas, while SAM allows for the analysis of trace elements with a resolution of 0.1nm. The 6700F is also a X-ray photon spectroscopy (XPS) microscope, which enables the collection of high-resolution X-ray spectra from surfaces. The spectroscopic files can be used to analyze the elemental composition and bonding states of the sample surface. Overall, JEOL JSM 6700 F is a versatile instrument for imaging and analysis of a variety of samples. Its cold field-emission gun, 3D imaging capabilities, automated sample chamber control, and XPS capabilities make it ideal for researchers of a wide variety of disciplines.