Used JEOL JSM 6700F #293672256 for sale

JEOL JSM 6700F Scanning Electron Microscope (SEM) is a cutting-edge device designed to provide users with a powerful and precise tool for characterizing the structure and composition of materials at the nano-scale level. JEOL JSM 6700 F incorporates a range of features and components to ensure the highest levels of quality imaging and analysis. JSM 6700F equipment is built around a fully automated system with a range of digital automation features. Intelligent SEM functions allow for fast and accurate operation even in the most demanding applications. The microscope has a high-throughput scan control unit along with an integrated thermal-flow-control machine and an advanced on-column auto-focus mechanism. These features combine to create an automated and precise imaging and analysis capability. The microscope has a field emission gun (FEG) that is capable of producing high-resolution images. This gun has a low spreading angle, long focal depth, low divergence, and a wide range of magnification. JSM 6700 F also comes with a variable pressure stage (VPS). This stage can be adjusted to different ranges of atmospheric pressure, making it possible to analyze specimens at different levels of detail. The microscope is equipped with a high-resolution secondary electron detector and a bright-field detector. These detectors can be used for a range of imaging, analysis, and measurement operations, such as identifying areas of high contrast, detecting surface features or fissures, and plotting line scans. JEOL JSM 6700F also comes with a range of software tools for data analysis and representation. These tools allow users to collect, plot, and analyze data from a range of specimen types. This includes image transmutation, image fusion, and the ability to create three-dimensional representations from images. In addition, JEOL JSM 6700 F includes a range of options that can further enhance the microscope's capabilities. These include a field-emission detector, oxygen cell, and column heater, as well as a range of sample preparation accessories. These extras help to improve the accuracy and resolution of the microscope's imaging and analysis operations. Overall, JSM 6700F Scanning Electron Microscope is a powerful and versatile tool for nanoscale research and analysis. It is an ideal choice for those wishing to achieve exceptional levels of imaging and analysis performance.