Used JEOL JSM 6700F #293754691 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) that utilizes secondary electrons (SE) to produce high-resolution images. The SEM is equipped with an ETL variable pressure SEM (VP-SEM) feature, which results in a reduced pressure of electron emission, allowing for increased specimen depth of field and resolution. By using a variable pressure of 0.1 Pa to 10 Pa, specimens can be studied in a range of ambient conditions. JEOL JSM 6700 F has an accelerating voltage of 0.1 to 30 kV, which results in a high dynamic range for maximum contrast imaging. This SEM offers a high-performance environmental chamber with temperature range up to 0 C to 135 C and a vacuum of up to 10-3 Pa. Additionally, this model features a high-sensitivity backscattered electron detector (BSE) and an EDX system that allow for the elemental composition analysis of the specimen with high accuracy. JSM 6700F is capable of collecting digital data that is used to create 3D images through electron tomography. This SEM also produces secondary electrons (SEs) as well as back and forth scanning capabilities. The SEs render an image of high contrast, while the back and forth scanning capability allows the specimen to be scanned repeatedly. The high performance field-emission source yields excellent high-resolution imaging with high sensitivity to small features and topography on the specimen. JSM 6700 F is equipped with a large working distance option, which allows for the viewing of the entire bead surface at the same time. Additionally, this SEM has the unique ability to produce multiple images at a single focus plane, combining analysis and imaging together. These features, along with the high-sensitivity detectors, make JEOL JSM 6700F an ideal choice for a wide range of applications, particularly for high-resolution imaging, ultra-resolution imaging, environmental scanning, and EDX. In short, JEOL JSM 6700 F is an excellent SEM choice for a variety of industrial, biomedical, and academic research purposes.