Used JEOL JSM 6700F #293775754 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) with a field emission gun (FEG) that allows for the observation of samples down to the nanometer scale. The electron source in this SEM is an FEG, which provides more stable, higher current and higher resolution than thermionic emitters, resulting in improved image resolution. This SEM is designed for imaging, elemental analysis and automated operation. JEOL JSM 6700 F has an operating voltage range of 30 to 30kV and a highly reliable liquid nitrogen cooling system. The system operates in variable pressure (VP) or variable vacuum (VV) modes. The lower detection limit of 1.2nm is possible in VP mode, while in VV mode it can be as low as 2.1nm. The magnification range of JSM 6700F is 10x to 500kX. The maximum field of view is 400mm, and the maximum resolution is 1.2 nm at 15kV in VP mode. For automated operation, JSM 6700 F is equipped with an automatic sample changer (ASC). This ASC allows for rapid changing of the sample set-up, which substantially increases sample throughput and accuracy of the analysis. JEOL JSM 6700F can also be controlled from an external computer, further increasing the potential data acquisition speed. JEOL JSM 6700 F can be used for a variety of applications including high magnification imaging, elemental analysis, EBSD (electron back scatter diffraction) and automated sample analysis. It has an secondary electron (SE) detector for standard imaging, a backscattered electron (BSE) detector for analysis of non-conductive materials, a Energy Dispersive X-ray (EDX) detector for elemental analysis and a large depth of field detector to provide a three-dimensional image. In addition to its imaging capabilities, JSM 6700F is also capable of X-ray Micro Analysis. The EDX detector enables elemental analyses of materials at the nanometer scale, providing results that are accurate to better than 1%. JSM 6700 F is well suited for research applications, R&D, quality assurance and failure analysis. The sampling capabilities and built-in automation of this SEM allows for quick and easy analysis and data collection.