Used JEOL JSM 6700F #293813761 for sale

ID: 293813761
Vintage: 2003
Field Emission Scanning Electron Microscope (FE-SEM) Energy‑Dispersive X‑ray spectroscopy (EDX) Electron Backscatter Diffraction (EBSD) Lithography capability Operating system: Windows 7 2003 vintage.
JEOL JSM 6700 is a high-performance scanning electron microscope (SEM) designed for a wide range of applications in fields such as materials science, physics, chemistry, and biology. It is equipped with a high-resolution field emission gun to provide clear imaging and accurate data. Additionally, it features a wide range of secondary electron and backscatter electron detections, coupled with dual SE detectors and a programmable AES analyzer. It offers a wide range of operating modes as well as excellent image quality in both low- and high-voltage scanning modes. JSM 6700 features a stage with a maximum sample size of 150 mm in diameter and a tilt range of up to 60 degrees. It uses a beam voltage of 0.1-30 kV and a beam current range of 0.5-20 nA. Its maximum magnification range is 6x-1000 000x. The microscope has an effective work distance of 10 mm and the Stage runs on a fully enclosed, 3-axis travel system that translates the sample in the x, y, and z directions. JEOL JSM 6700 provides a vast array of analytical capabilities utilizing Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD). It can probe crystal structures and perform scans in SEM mode, in which images are obtained from the interaction of electrons with the sample. The EDS feature allows elemental composition of materials to be identified and analyzed and in its EBSD mode the microscope can be used for orientation mapping. JSM 6700 is also equipped with a range of accessories to enhance its capabilities, such as an automated sample exchanger, a vacuum system, a sample holder, and a deflector/rotator gun. It is also compatible with a wide range of software designed to control the microscope and assist in developing results, such as JEOL Easy-SEM Image Acquisition Software. Overall, JEOL JSM 6700 is an advanced SEM designed to assist researchers in their analysis, ideal for materials, chemistry, physics, and biology-related studies. Its high-resolution imaging, combined with the wide range of features and functionalities, makes it an incredibly versatile microscopy tool for researchers in various disciplines.
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