Used JEOL JSM 6700F #46262 for sale

JEOL JSM 6700F is a versatile scanning electron microscope (SEM) with a wide range of capabilities. The SEM is designed to provide the highest resolution imaging and analysis capabilities, and utilizes a combination of several technologies to achieve its impressive performance. JEOL JSM 6700 F is equipped with a field emission gun (FEG) electron source, which provides superior brightness and resolution over traditional thermionic electron sources. This feature enables the ability to perform higher resolution imaging and elemental analysis on a wider variety of samples. The equipment is also equipped with an adjustable, three-dimensional stage for added flexibility. This stage allows for precise sample manipulation and imaging, as well as survey and point and click automated area scan functions. The microscope is also equipped with an electron reflected image (REPIM) detector, which is designed to detect high-energy electrons reflected from the sample. This feature allows for imaging of a wider range of morphologies and gives high-contrast images at resolutions higher than those attainable with other detectors. The REPIM detector also allows for quick, easy, and accurate elemental analysis of a sample by providing a more adequately defined element profile. The system is also equipped with a Digital Pulse Processor (DPP), which is able to detect and process delicate electrons and provide fast, reliable, accurate time-correlated imaging for dynamic sample analysis. The DPP is also capable of detecting delicate electrons and providing stable analysis for continuous operation. Other features of the unit include a built-in computer with high-speed network connectivity, a real-time parameter display, image zooming and more. These features come together to give JSM 6700F powerful and reliable performance. JSM 6700 F is a powerful and reliable scanning electron microscope that gives high-resolution imaging and elemental analysis of various samples. The machine comes equipped with a wide array of features that make it an ideal choice for research and industrial applications. Its combination of FEG, REPIM and DPP technologies as well as its user-friendly controls allow for comprehensive sample analysis and make it a versatile and reliable tool for scientists and engineers.