Used JEOL JSM 6700F #9146244 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) with unique capabilities for detailed nanoscale imaging at high speed. This instrument is capable of operating in both secondary electron (SE) and backscattered electron (BSE) modes, and offers exceptional imaging resolution down to 1nm. It is equipped with an ultra-thin silicone film detector which allows for real-time imaging, as well as fast digital signal processing. Furthermore, JEOL JSM 6700 F can be integrated with additional hardware and software such as an energy dispersive spectrometer (EDS) for elemental analysis. JSM 6700F makes use of an accel-decel lens system for SE and BSE imaging, and provides extremely high-resolution imaging with low noise. This results in images free of the artefacts and distortions that are characteristic of regular scanning electron microscopy. Furthermore, the instrument is capable of simultaneous multiple beam operation, allowing for improved imaging speed. Compared to regular SEMs, JSM 6700 F offers superior vacuum requirements, as well as improved operation stability and lifetime. This allows for long-term imaging, as well as higher efficacy in obtaining desired imaging conditions quickly. JEOL JSM 6700F SEM is also capable of 3D imaging in both SE and BSE modes, due to the asynchronous imaging mode. The asynchronous mode consists of a rapid pulse cycle during which multiple images are acquired, allowing for the creation of 3D images. JEOL JSM 6700 F is ideal for use in scientific research and in industrial applications, as it provides extremely high resolution imaging capabilities at speed. The versatility and flexibility of the instrument, combined with its high-definition imaging capabilities, make it an ideal choice for researchers seeking for exceptional imaging quality and accuracy.