Used JEOL JSM 6700F #9226660 for sale

JEOL JSM 6700F
ID: 9226660
Vintage: 2007
Scanning Electron Microscope (SEM) 2007 vintage.
JEOL JSM 6700F is a type of scanning electron microscope (SEM) designed and manufactured by JEOL Ltd., an international leader in analytical instruments and electron optical technology. It is a high-resolution SEM designed specifically for imaging with an electron beam at the nanometer scale. JEOL JSM 6700 F is equipped with a two-pole magnetic field-emission gun, enabling a high brightness electron source to provide ultimate performance and resolution. The high-tension accelerating voltage range is from 0.1 kV to 30 kV, providing a wide range of spectrum wavelength compatibility and operating temperatures ranging from -20 degrees Celsius to +5 degrees Celsius, making it suitable for use in a wide range of applications. JSM 6700F is equipped with a cold-field emission (CFE) electron source which provides maximum brightness and stability when operating at low voltage. It also features a high resolution field emission gun (FEG) with a 0.14 nanometer spot diameter which allows for imaging of small samples, such as molecular structures. This microscope is capable of producing high-resolution images at high magnifications, high-speed scanning, and low-noise performance. Advanced imaging features, including automated focus and tilt correction, high-precision auto-stigmas, and automated image stitching, ensure that even complex samples can be imaged with high accuracy, providing detailed 3D views. JSM 6700 F is also compatible with a range of detectors, including STEM and cathodoluminescence detectors, as well as an energy dispersive X-ray detector. To ensure flexibility and versatility, the microscope can also be equipped with an attached environmental chamber for imaging samples at temperatures ranging from -100° Celsius to +100° Celsius. Additionally, JEOL JSM 6700F includes built-in digital imaging capabilities, allowing the user to record, store, and analyze images with ease. JEOL JSM 6700 F is an ideal scanning electron microscope with the features, capabilities and performance needed to image a wide variety of samples at the nano-scale. With its advanced imaging features and flexibility, JSM 6700F is an ideal imaging solution for researchers and analytical labs in many industries.
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