Used JEOL JSM 6700F #9233189 for sale

JEOL JSM 6700F Scanning Electron Microscope (SEM) combines excellent imaging and analytical capabilities in a single instrument. It is capable of providing high-quality images at large magnifications. The system is equipped with a cold field emission gun (FEG), which is the latest technology in electron gun design. This FEG provides a bright high-resolution electron beam and enables the use of electron energies ranging from 1kV to 30kV, making it suitable for a variety of materials. It also offers high resolution imaging with its scan resolution of 0.5nm. JEOL JSM 6700 F features a large chamber with a work stage that can accommodate samples up to 8 inches in diameter. To further improve its flexibility, it is possible to add optional accessories including sample holders for standards, wafer substrates, and a motorized stage for automated operation. JSM 6700F's advanced features allow it to be used for a variety of applications. Its high-resolution allows for imaging of fine details on a sample's surface. It can also be used for compositional analysis with energy dispersive X-ray (EDX) spectroscopy, Auger spectroscopy and electron trapping techniques. Furthermore, its large chamber and automated stage make it suitable for 3D imaging and topography analysis, allowing the user to analyze and image entire samples. In addition to its excellent imaging and analytical capabilities, JSM 6700 F is also equipped with a variety of safety features to ensure the user's protection while operating. It includes a vacuum interlock system, emergency stop switch, and an overload protection system. JEOL JSM 6700F is a versatile and powerful SEM that offers excellent imaging and analytical capabilities. Its bright electron beam, large chamber, and variety of accessories allow it to be utilized for a wide range of applications. It also features a variety of safety features for the user's protection and security.