Used JEOL JSM 6700F #9248482 for sale

JEOL JSM 6700F Scanning Electron Microscope (SEM) is an advanced imaging and analysis instrument for characterizing particles ranging from 1µm to 50 µm. It offers superior imaging capability with up to 5,000 magnification, and features a physically-vacuum-sealed chamber for safe and repeatable operation. JEOL JSM 6700 F is a dedicated SEM that provides excellent specimen clarity via its electron column. The device employs the latest in electron optical technology, allowing users to easily and quickly observe particles of all sizes and shapes. The SEM is designed to accommodate a wide range of sample sizes, configurations, and sample mounting techniques, providing optimum imaging capabilities in a wide range of materials and conditions. JSM 6700F features an integrated, variable-pressure chambel coupled with a unique, second-generation variable-pressure detector design. This combination of features provides image clarity and retention by minimizing charging effects. The SEM's variable-pressure detector design also allows operation at very low pressure levels, allowing users to capture detailed images of a wide range of materials and microstructures, regardless of sample size. JSM 6700 F utilizes a variety of modes and techniques, ranging from simple fixed intermediate magnification to high-resolution micrography. It is equipped with a range of mode-specific detectors and imaging tools and can be used in a wide variety of sample environments, including the traditional laboratory setting. The SEM also enables operation in a variety of continuous and pulsed emission modes and allows users to switch between different operating parameters. The SEM's energy dispersive X-ray spectrometer (EDS) facilitates detailed and high-resolution elemental analysis. JEOL JSM 6700F also includes a number of automated alignment and calibration features that ensure consistent and reliable performance. In addition, JEOL JSM 6700 F is equipped with a range of high-end features that allow users to efficiently manage their data and results. The SEM features an easy-to-use data management system and integrated reporting capabilities that enable users to quickly and easily report their results. Overall, JSM 6700F is an advanced and feature-rich SEM that offers effortless and reliable imaging and analysis of particles ranging from 1 µm to 50 µm. The integrated detectors and imaging tools, combined with automated alignment and calibration features and data management capabilities, provide users with a comprehensive imaging and analysis platform that guarantees consistent and accurate results.