Used JEOL JSM 6700F #9294954 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) from JEOL. It is an advanced instrument for microscopic imaging and analysis, capable of producing both high-resolution secondary and backscattered electron (BSE) images. The equipment is equipped with a large specimen chamber and a four-axis motorized stage, allowing for precise navigational control of the specimen. In addition, the system also offers high magnification and low vacuum performance. JEOL JSM 6700 F can be used to analyze surfaces and materials at magnifications up to 250,000x. The electron beam is helical scanned, allowing the user to control the size and shape of the electron probe. In addition, the unit is also equipped with a bright field and differential interference contrast (DIC) optics machine, allowing for the observation of small details in three dimensions. The tool is also equipped with a range of detectors, allowing for the capture of a variety of different image types. These include a secondary electron detector, a backscattered electron detector, an EDS detector, a SE2 detector, an Auger detector and a cathodoluminescence detector. With these detectors, users are able to analyze a wide range of materials and investigate different surface features. The user can also add various options to the instrument, including an auto-image stitcher, high-vacuum operation, a temperature-controlled stage, a strain gage analysis asset, and a gas-injection model. These options will allow the user to extend the capabilities of JSM 6700F for various applications. Finally, JSM 6700 F equipment comes with advanced software, allowing full control and automation of the instrument. The software also provides tools for the analysis and imaging of data, including tools for the generation of electron probe maps. This makes the system an ideal choice for advanced surface analyses and imaging.