Used JEOL JSM 6700F #9356046 for sale

JEOL JSM 6700Fis a high-performance field emission scanning electron microscope (FESEM). It is equipped with a multi-mode detector that is capable of imaging in both secondary and backscattered electron modes. This enables the microscope to be used for both imaging and analytical applications. The microscope is also fitted with an in-column aperture system which can be 'pluggable'. This facilitates angle dependent imaging with variable beam convergence allowing fine details to be resolved in complex samples. The primary FESEM imaging features good image quality and flexibility. This is achieved thanks to its ultrahigh brightness source and its adjustable operating parameters such as accelerating voltage and beam current. The FESEM also has fully digital hardware and software control and can be operated remotely via a user interface. The FESEM is also equipped with an auto stage scanning system. This allows a sample to be scanned in multiple directions with auto-to-position repeatability. The stage also has an integrated in-vacuum rotary stage for 3D imaging capabilities. JEOL 6700F FESEM is also capable of a variety of analytical techniques. It can be used for Energy-Dispersive X-Ray Spectroscopy (EDS) and Wavelength Dispersive X-Ray Spectroscopy (WDS). These tools can provide elemental analysis (both qualitative and quantitative) of sample components. In addition the FESEM can be used for Electron Energy Loss Spectroscopy (EELS) measurements which can be used to identify and quantify different chemical bonds in a sample. Overall, JEOL JSM 6700F is a powerful and versatile tool for analyzing materials in both imaging and analytical applications. Its high performance features and its capability to perform sophisticated analytical measurements make it a valuable instrument for researchers in the fields of materials science, nanotechnology and semiconductor device fabrication.