Used JEOL JSM 6700F #9384886 for sale

JEOL JSM 6700F is a field-emission scanning electron microscope (FESEM) that combines high performance with easy usability. This highly advanced FESEM is capable of high resolution imaging and a variety of analytical techniques for the characterization of a range of materials. JEOL JSM 6700 F's design emphasizes user convenience, utilizing a motorized x-y stage and touch screen user interface. Sample loading and movement, imaging, detection level adjustments, and more are all easily performed with the ergonomic interface. The instrument is equipped with a high-performance electron optics column, focusing on high-resolution imaging and low-dose operation. It also supports a variety of analytical techniques, including EDS analysis and WDS analysis, making it ideal for a range of applications. The high-performance scanning electron optics of JSM 6700F is optimized for reducing electron-beam-induced damage which reduces sub-micron resolution imaging and low-dose operation. The high-resolution capability of the microscope is further enhanced by the installation of a Schottky field emission gun which produces highly-collimated electron beams at low accelerating voltage. The combination of optimized electron optics, low accelerating voltage, and Schottky gun results in superior imaging resolution and low-dose operation. In addition to its impressive resolution, JSM 6700 F also features a wide range of analytical capabilities. Energy-dispersive X-ray spectroscopy (EDS) and wavelength-dispersive X-ray spectroscopy (WDS) are supported by the the probe current adjustment system and secondary electron imaging capabilities. This allows for the elemental analysis and microanalysis of both organic and inorganic specimens. JEOL JSM 6700F is a versatile and powerful scanning electron microscope. It combines advanced electron optics and unique features such as a Schottky gun to deliver exceptional resolution and analytical capabilities with minimal-radiation exposure of the specimens. This combination of features creates an ideal tool for a multitude of materials and material research.