Used JEOL JSM 6700F #9402131 for sale

JEOL JSM 6700F is a high-performance scanning electron microscope (SEM). This particular SEM is highly versatile and features advanced imaging capabilities, making it an excellent choice for many advanced imaging applications. JEOL JSM 6700 F is designed and constructed with a field-emission gun (FEG) electron source, ensuring excellent energy resolution and minimal beam drift. This model is equipped with an Everard Tilly in-lens ion detector and OMISA Omnispectral detector, which provide optimum image focus and quality, while providing a wide range of imaging capabilities. Other features of JSM 6700F include a digital scan control system, a bright-light illuminator, an ion detector with diffraction capabilities, and a high-resolution digital camera system. JSM 6700 F is capable of providing excellent imaging resolution down to 1.5 nm or less, making it ideal for sophisticated applications such as small-scale imaging of cellular structure and particle surface topography. Furthermore, its automated scan control system allows for quick and precise sample navigation and imaging, resulting in increased efficiency and reliability. This model also has both field-emission and secondary electron imaging capabilities, enabling users to capture both topographical and compositional details. JEOL JSM 6700F is a robust, reliable and versatile SEM designed to meet the highest imaging and analytical requirements. It is an ideal tool for those seeking to perform detailed imaging and analysis of a wide variety of samples, from cells and nanoparticles to materials and integrated circuits. This model features a digital camera for enhanced imaging control, a bright light illuminator for sample viewing, and a broad range of imaging and analytical capabilities, making it an ideal choice for a wide range of experimental applications.