Used JEOL JSM 7000F #293622852 for sale

JEOL JSM 7000F
ID: 293622852
Field Emission Scanning Electron Microscope (FE-SEM).
JEOL JSM 7000F is a type of Scanning Electron Microscope (SEM). It is a high-performance equipment that provides unprecedented resolution and analytical performance that enables users to easily observe and analyze microscopic structures in great detail. The advanced optical system of JEOL JSM 7000 F delivers a sharp, high-contrast imaging of fine details. The unit is equipped with a CCD camera that provides high-resolution images and a powerful optical magnifying power. JSM 7000F is designed for both hydrogen-type and differential-mode analyses. It is capable of detecting trace elements in high levels of detail. The machine also features a fully automated automated imaging tool, which allows for the fast and precise capture of image data. JSM 7000 F is also capable of performing multiple energy-dispersive X-ray (EDX) spectroscopic analyses. EDX spectroscopy is used to analyze micron-scale elemental compositions and other microscopic features. This allows for the identification of the elements present in a sample, as well as their magnitude and relative intensity. The 700F is also capable of carrying out EDX spectroscopy studies that involve the examination of semiconductors. JEOL JSM 7000F is also designed to be used for high-resolution scanning electron microscope (HR-SEM) applications. The asset is equipped with a high-resolution column control unit (HRCCU), which enables precise control of the detector resolution and magnifying power. This allows for the precise mapping of micron-scale signals, as well as capturing them in high-resolution images. JEOL JSM 7000 F also includes many performance enhancing components such as an automated stage tilt control unit, which allows the model to further analyze specimens. The equipment's software also provides a wide range of image processing and analysis tools to aid with the evaluation of data and enhance the understanding of the structures being studied. Overall, JSM 7000F is a powerful scanning electron microscope that can provide detailed images and measurements of microscopic structures. Its advanced optical system, automated imaging unit, and various performance enhancing components make it an ideal machine for electron microscopy.
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