Used JEOL JSM 7000F #293634856 for sale

JEOL JSM 7000F is a scanning electron microscope (SEM) that is used to observe the surface and structure of a variety of materials. The equipment is well equipped to handle advanced imaging and analytical needs, such as 3D surface imaging, high-resolution imaging, EDS, WDS, high-resolution lattice imaging, X-ray mapping, and more. SEM technology is an invaluable tool for examining a wide range of materials, from organic to inorganic, metals, minerals, crystals, and more. For example, JEOL JSM 7000 F is capable of producing images of greater than 3 nm resolution when using a tungsten filament electron source. Its ultra-high scanning speed of 10,000 μm/s allows for fast object scanning, whilst the high vacuum chamber enables examination of larger areas with greater detail. Other features of this system include a UPS Field Emission Gun (FEG) to enable high-resolution imaging of specimens as small as 2 nm in size, faster performance due to lower operating pressure, and the potential for in-situ experiments. The unit includes a variety of imaging accessories, such as interference filters, stage risers and holders, and other mechanical components that can be used to manipulate components during an experiment. Furthermore, advanced energy-dispersive spectroscopy (EDS), wavelength-dispersive spectroscopy (WDS), and X-ray mapping capabilities allow users to perform more detailed analysis of their samples. In terms of analytical applications, JSM 7000F can be used to perform elemental mapping on a variety of materials, such as metals, alloys, biomaterials, semiconductors, and more. It is capable of imaging materials at atomic and nanoscale levels, and the addition of the FEG gun allows for imaging of even smaller objects. Furthermore, the machine is equipped with a variety of software packages that allow users to capture, analyze, and manipulate images from different sample types. Overall, JSM 7000 F is an advanced and reliable scanning electron microscope that is suitable for a range of applications from imaging to elemental mapping. Its features, such as ultra-high resolution augment user capabilities and make it an ideal choice for advanced imaging and analytical needs.