Used JEOL JSM 7000F #293649519 for sale

JEOL JSM 7000F is a scanning electron microscope (SEM) that offers an unparalleled combination of imaging capabilities, accuracy, and ease of use. JEOL JSM 7000 F utilizes an advanced field emission scanning electron source to deliver exceptional image quality, providing optimal resolution and contrast, while preserving user safety. This scanning electron microscope is capable of operating in high vacuum, low vacuum, and environmental modes, allowing researchers to precisely analyze small specimens from all regimes. The microscope offers several useful features for quick and easy operation. The auto-focus system ensures crisp and clear images, allowing the user to quickly focus on the sample with a single click. This microscope also comes equipped with an automated sample navigation system, enabling the user to align their sample precisely and accurately resulting in sharper, more detailed images. JSM 7000F provides a wide range of image analysis capabilities, enabling users to measure distances, detect components, and view the relationships between samples and their environment. Its electron beam tunnel detector enables invisible structural elements to be accurately captured, while its 3D optical display allows analysis of surface topography. Its environmental SEM also allows for analysis of samples under controlled conditions, giving researchers the ability to observe biological and other material in their natural state. JSM 7000 F can be equipped with a range of specialized detectors, allowing for precise imaging of any specified area or element. With advanced energy dispersive X-ray spectroscopy (EDS) capabilities and simultaneous EDS/SEM analysis, researchers can obtain quick and accurate analysis of the elemental composition and distribution of their sample. This scanning electron microscope is also equipped with an advanced hardware design that enables fast and accurate image retrieval, enabling researchers to quickly and easily document their results and share them with others. JEOL JSM 7000F is an advanced SEM that is designed to meet the most rigorous requirements of microscopy. Its advanced imaging capabilities, combined with the ease of operation and large range of potential applications make it an ideal choice for today's research laboratories. With its accessible price point and impressive list of features, JEOL JSM 7000 F is an excellent choice for any researcher looking to take their imaging capabilities to the next level.