Used JEOL JSM 7000F #293663250 for sale

JEOL JSM 7000F is a scanning electron microscope (SEM) designed to provide high-resolution imaging of microscopic biological and material surfaces. The instrument is equipped with a JEOL FEG950C 1.5 nm accelerating voltage. This allows for detailed imaging of delicate biological specimens or materials down to the nanoscale level. JEOL JSM 7000 F is well-suited for low-vacuum examination of dielectric materials and non-conductive samples. This is accomplished through its cold field emission gun (FEG) source and low-vacuum secondary electron detector. These features offer excellent imaging capabilities for non-conductive samples which may also require observation of finer surface details. JSM 7000F also features an impressive range of automated image acquisition options. These options allow for the automated scanning of large samples or rapid scanning of repetitive patterns. JSM 7000 F also includes Zeiss SmartSystem auto focusing and sample holder exchange which simplify and speed up the imaging process. JEOL JSM 7000F is equipped with a range of features and accessories to ensure optimal imaging and sample control. Anastigmat Antioblur lens provides enhanced beam control while a full range of excitation Sources, Ion Beam Current Monitor, Vacuum Leakage Gauge and a Peltier System ensure precise sample control and preparation. JEOL JSM 7000 F also includes a range of sample preparation tools such as carbon or gold coating, evaporative coating and ion etching. In conclusion, JSM 7000F is a highly advanced scanning electron microscope designed to provide exceptional imaging of a variety of delicate and intricate biological and material surfaces. The range of imaging options, automated sample preparation and exchange features make it an invaluable tool for professional research settings.