Used JEOL JSM 7000F #293748718 for sale

ID: 293748718
Vintage: 2012
Field Emission Scanning Electron Microscope (FE-SEM) Electron gun: Schottky field emission Electromagnetic deflection Conical objective lens Specimen chamber, 8" Working distance: 2 to 40 mm Specimen illumination: 0.1 pA to 10 nA Resolution:1.2 nm at 30kV to 3 nm at 1kV Magnification: LM Mode: 10x to 19,000x SEM Mode: 100x to 500,000x Power supply: 0.5 to 30kV.
JEOL JSM 7000F is a scanning electron microscope (SEM) developed by JEOL as part of their 7000F family of scanning electron microscopes. It is an updated version of the previous 6000F, and has been designed with advanced features to enable precision imaging and analysis. JEOL JSM 7000 F is a temperature-controlled SEM which makes use of a cold field emitter to produce a focused beam of electrons. This beam is directed to the sample which then returns an enhanced signal in comparison to the 6000F models. This allows the 7000F to achieve a higher resolution. Additionally, the 7000F is capable of producing a more accurate and enhanced 3D image of the sample due to its improved depth of focus. Its Automated Focus Enablement System (AFES) helps to achieve optimal focus for each image taken. JSM 7000F also takes advantage of its large working distance, up to 33mm between the specimen and the objective lens, to produce a clear image without the sample needing to be in direct contact with the lenses. This larger working distance makes the 7000F ideal for imaging samples prone to damage, such as nanomaterials. JSM 7000 F also features an automated stage, allowing increased stability and reliability when moving the sample. Coupled with its high flexibility, it can be used to study a wide range of samples, including materials of all shapes and sizes. The 7000F is also capable of investigating high temperature materials, as well as frozen samples down to -100 degrees Celsius. This is achieved by the use of a Gatan Enfinium cryo-stage and liquid nitrogen cooling accessory, allowing the user to take high quality images of specimen which are frozen. JEOL JSM 7000F is capable of producing detailed, high resolution images and remains an effective tool for the study of nearly any kind of sample for both imaging and analysis. With its improved signal-to-noise ratio, flexible design and automated stage, it remains an important instrument in helping researchers to investigate samples with accuracy and precision.
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