Used JEOL JSM 7000F #9145727 for sale

JEOL JSM 7000F is a high-performance scanning electron microscope (SEM) designed for excellent imaging and accurate analytical capabilities. It is equipped with a field emission electron source and an environment-friendly Tribo-gun™ for higher incident electron currents and improved contrast. The beam has a maximum accelerating voltage of 30kV to provide excellent resolution and greater depth of focus than conventional SEMs. Other features include cold field emissions, small spot sizes of around 1-2nm, high brightness, and minimal astigmatism. JEOL JSM 7000 F offers unique imaging capabilities for a wide range of materials and applications, including semiconductors, nanomaterials, composites, medical specimens, and more. The electron source provides outstanding ultra-low-voltage imaging for imaging highly conductive and/or magnetic materials at lower voltages than typical SEM systems. The high-resolution imaging capability allows you to easily identify subtle features and defects while the superior depth of field allows robust quantitative measurements on any part of the sample. The microscope is also equipped with a coaxial gun lens system and a working distance of 12 -36mm. This allows the user to change the working distance and resolution easily and quickly. JSM 7000F also comes with advanced imaging tools such as automated contrast and brightness adjustment, simultaneous imaging in multiple fields of view, and automatic focus adjustment. For analytical purposes, JSM 7000 F is equipped with a fully integrated EDS detector. This energy-dispersive spectroscopy technology is optimized for fast, accurate elemental analysis in a wide range of applications. The precision sample stage provides smooth, fast movement for scanning and X-ray mapping. Overall, JEOL JSM 7000F is a powerful, high-performance SEM that can provide excellent imaging and accurate analysis for a variety of specimens. Its advanced electron source, precision sample stage, and integrated EDS detector make it an ideal solution for both imaging and elemental analysis.