Used JEOL JSM 7000F #9227135 for sale

ID: 9227135
Field Emission Scanning Electron Microscope (FE-SEM).
JEOL JSM 7000F is a high-performance scanning electron microscope (SEM) that provides operators with comprehensive analysis capabilities and superior imaging resolution. The instrument features an ultra high vacuum (UHV) system, advanced contrast technologies and a wide range of analytical accessories. As a result, JEOL JSM 7000 F is widely used for a variety of applications, such as neuroscience research, materials science, industrial failure analysis and forensic investigation. JSM 7000F has a 20 mm gap size and a wide range of supporting current ranges, allowing users to examine specimens in high resolution and fine detail. The instrument's field emission source also enables higher resolution imaging with lower operating voltages, resulting in higher signal-to-noise ratios and improved contrast. Additionally, the UHV system provides excellent sample stability, facilitating quick and easy sample loading/unloading. Analytical components available for JSM 7000 F include electron back scatter diffraction (EBSD), energy-dispersive X-ray spectroscopy (EDS), X-ray mapping and electron-induced X-ray emission (EIKE) capabilities. These components allow the instrument to rapidly acquire detailed information regarding the structure, composition and properties of a specimen. JEOL JSM 7000F can also be integrated with SPM probes and complementary techniques, such as Raman spectroscopy, to further enhance its analytical capabilities. JEOL JSM 7000 F is equipped with numerous software control tools that allow users to monitor, optimize and maximize the microscope's performance. Some of the software controls provided include image stacking, automatic image stitching and video recording. This allows users to easily capture data for subsequent analysis. The microscope also features an intuitive user interface, providing operators with quick access to all the controls and features. Overall, JSM 7000F is an excellent choice for those seeking a powerful, high-performance SEM for advanced, analytical research. With its UHV system, wide range of analytical capabilities and intuitive software, the instrument delivers excellent results for a variety of applications.
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