Used JEOL JSM 7000F #9279675 for sale
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ID: 9279675
Field Emission Scanning Electron Microscope (FE-SEM)
Computer
Detectors:
Secondary Electron Image (SEI)
Backscatter (BEI-TOPO/COMPO)
Electron Backscatter Diffraction Detector (EBSD).
JEOL JSM 7000F is a low-voltage field-emission scanning electron microscope (SEM). It is a powerful tool used for imaging and analysis of surfaces at high magnifications, allowing high-resolution imaging of a range of materials, from soft biological materials to hard metallic and ceramic substances. JEOL JSM 7000 F employs a Schottky electron field emission gun, allowing for the emission of high-brightness electrons with low background noise. This enables superior resolution and contrast, with images with a resolution of up to 2nm. The high imaging quality of the SEM is further augmented by the advanced software system, which features a range of pre-set functions and can be customized for different types of analysis. JSM 7000F also features a variable-pressure chamber, which enables operation at pressures ranging from high vacuum to atmosphere. This allows for the observation of specimens in their native environment, along with the observation of the high-pressure effects on observations and the secondary electron signal. Other features of this SEM include a large specimen chamber with motorized specimen stage and a large field of view (up to 50mm), allowing for the study of larger samples. The high-speed digital image acquisition system allows for the capture of up to five frames per second with a wide range of imaging techniques, such as backscattered electrons (BSE), composition map (EDX) and phase/crystallography (EBSD). The SEM is highly user-friendly, with a touchscreen display and an intuitive user interface, enabling users to easily configure different settings and measurements. It also comes with a range of dedicated accessories, such as detectors, specimen holders, sample preparation systems and imaging systems, allowing for the customization of JSM 7000 F for specific types of analysis. Overall, JEOL JSM 7000F is an extremely versatile and powerful SEM, featuring high-resolution imaging and analysis capabilities, an adjustable pressure chamber and a user-friendly interface. These features make it an ideal instrument for a wide range of imaging and analysis applications, from materials science to life sciences.
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