Used JEOL JSM 7001F #293606612 for sale

JEOL JSM 7001F is a scanning electron microscope (SEM) with an advanced automated system which can provide reliable and reproducible images in both the environmental and the controlled ultra high vacuum modes. It features a field emission electron gun, a large working distance of 980mm, a vacuum of 5x 10-7 Torr, a resolution up to 4.0nm, and a digital camera for limiting information loss. The field emission electron gun is composed of a filament, a focusing grid and pole pieces, which enable a beam acceleration voltage from 0.05 to 30 keV. This gun can increase the confinement of electrons, allowing for high-resolution imaging at high magnifications and fast work speeds. The large working distance allows for the use of the standard SE and BSE detectors, as well as the newer EDX detectors, with the sample never having to touch the stage, reducing the risk of contamination. The vacuum system consists of a rotary pump and a diffusion pump, which combine to achieve an ultra high vacuum of 5x 10-7 Torr in the column. The resolution of JEOL JSM-7001F is 4.0nm at an accelerating voltage of 5-15keV, making it capable of imaging even the smallest features in your sample. JSM 7001F includes a digital camera to ensure images are accurately acquired and stored. It also has a FIB (Focused Ion Beam) capability, which enables a precise cross sectional analysis of the sample. This SEM is equipped with features such as automated navigation, which helps to quickly locate features of interest in the sample or to measure between two points. This capability allows for faster analysis of samples, especially when several images need to be acquired or compared. In conclusion, JSM-7001F is an advanced scanning electron microscope with a field emission electron gun, a large working distance of 980mm, an ultra high vacuum of 5x 10-7 Torr, a resolution of 4.0nm at an accelerating voltage of 5-15keV, and a digital camera. This SEM is capable of precise FIB analysis, automated navigation, and is designed for quick analysis of several images.