Used JEOL JSM 7001F #9267101 for sale

JEOL JSM 7001F is a scanning electron microscope (SEM) used for a variety of microscopy applications in the fields of materials science, biology, and industrial analysis. With its EverVon imaging equipment, a high-resolution BSE detector, an integrated X-ray energy-dispersive spectroscopy (EDS) system, and an optional high-resolution EDS unit, it is a powerful device for exploring microstructures. JEOL JSM-7001F's high resolution imaging capabilities stem from its in-column electron optics, which features an EverVon secondary electron detector. This detector generates very high resolution images of surfaces and interfaces, providing detailed insights into sample components. The integrated X-ray EDS machine is capable of detecting up to 10 elements with a spatial resolution of up to 0.3 μm. This allows the user to quickly and easily map elements within a sample and gain more information about its chemical composition. Additionally, the optional high-resolution EDS tool can detect up to 63 elements with resolutions of 0.2 μm or better. JSM 7001F has a flexible column design that allows for a wide range of sample holders, including those for cross section, transmission electron microscopy, and X-ray microanalysis. The scanning stages are motorized and fitted with B-axis tilt for positioning sample. The B-axis tilt eliminates the need for a separate goniometer. The motorized scanning stages also provide the user with precise control over sample positioning and movement. In terms of operating environment, JSM-7001F is totally enclosed and features an "intelligent" vacuum pump, which can automatically adjust the operational pressure according to the needs of the sample. Furthermore, the EverVon imaging asset features digital imaging and image enhancement functions. Finally, JEOL JSM 7001F is equipped with a range of automated modes for switching, scanning, and data acquisition parameters. In conclusion, JEOL JSM-7001F is an ideal choice for a variety of microscopy applications. Its high resolution imaging capabilities, integrated secondary and X-ray EDS systems, and automated modes allow for an efficient and complete exploration of a sample's structure and chemical composition.