Used JEOL JSM 7200F #9376080 for sale

JEOL JSM 7200F scanning electron microscope (SEM) is a versatile instrument for high resolution and high throughput imaging and analysis. It is suitable for a wide range of applications, from materials science to biological research and industrial inspection. Using a combination of electron optics and an array of electronic detectors, JSM 7200F produces detailed images of samples on the nanometer scale. Its field-emission gun electron source provides high beam currents, even at extremely low magnifications, allowing detailed imaging of both hard and soft materials. JEOL JSM 7200F also incorporates a range of automated analytical functions. Energy dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS) provide chemical information on the sample, while automated image processing routines (MAPS) give precise three-dimensional measurements of the sample's topography. JSM 7200F has several high resolution imaging modes, including SEI and BSE, which are optimized for surface imaging and weakly absorbed elements, respectively. Backscatter detector (BAD) mode produces highly sensitive images of thick biological sections, while a Tomography Scanning ADC (TSADC) mode allows the user to capture all the details of a 3D specimen in a single image. JEOL JSM 7200F boasts a generous 200 mm stage, with a wide range of motion control. Its full floorplan tilting system and 6 axis motion control system allow for optimized imaging at any tilt angle. With its motorized focus, JSM 7200F can keep track of the entire sample surface for enhanced imaging. Advanced features on JEOL JSM 7200F include a Beam Blanker for suppressing stray beam radiation, an automated debris collector to keep the chamber clean, and an integrated cooling system to keep sample temperatures stable. JSM 7200F's combination of rigorous design and cutting edge technologies make it an excellent choice for a wide range of research and industrial applications. Its superb imaging capabilities, range of analytical tools, and intuitive user interface make it an ideal tool for investigating nanoscience and other materials, both hard and soft.