Used JEOL JSM 7500F #293623399 for sale

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ID: 293623399
Field Emission Scanning Electron Microscope (FE-SEM).
JEOL JSM 7500F is a scanning electron microscope (SEM) that offers advanced analytical capabilities and imaging performance. JEOL JSM-7500F features a flexible magnification range from 5x up to 300,000x, allowing for precise imaging of the finest details. The highly stable and reliable column design of JSM 7500F ensures precise images with superior resolution. JSM-7500F uses an array of advanced imaging techniques for detailed analysis. These include conventional secondary electron (SE) imaging, back-scattered electron (BSE) imaging,x-ray microanalysis, and cathodoluminescence (CL) imaging. By using a combination of the different imaging modes, it is possible to observe the composition, thickness, and other properties of samples. JEOL JSM 7500F is equipped with a vacuum chamber that is designed to maintain a high vacuum environment during operation. This helps to prevent thermal damage to delicate specimens and preserves the organic integrity of the sample. Additionally, the SEM also features a low-vibration design to reduce the risk of sample drift and improve imaging quality. The microscope is operated using an intuitive user interface, allowing users to easily navigate through the features and settings. The software is capable of automatic operation and can execute large batches of images while providing feedback in the form of images and statistics. For advanced users, the microscope is also compatible with various other tools and accessories such as image processing software packages. JEOL JSM-7500F provides excellent image capture capabilities, with options for high speed imaging for capturing rapid changes in samples. Additionally, JSM 7500F also supports a host of advanced automation features such as autonomous operation, sample exchange, and automatic focus. This makes the instrument suitable for a variety of applications and facilitates quick sample processing. In short, JSM-7500F is a flexible and reliable scanning electron microscope that provides excellent imaging and analytical capabilities. With its intuitive user interface, powerful automation features, and advanced imaging techniques, JEOL JSM 7500F is a powerful research tool for anyone looking for detailed analysis of samples.
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