Used JEOL JSM 7500F #293641220 for sale

JEOL JSM 7500F is a scanning electron microscope (SEM) that is used for advanced imaging and analysis of surface and sample features. This SEM is equipped with a suite of advanced imaging and analysis capabilities, including stage sample scanning for detailed surface viewing, multi-beam electron column for simultaneous imaging of multiple areas, and the ability to analyze a wide range of materials from metals and semiconductors to organic compounds. JEOL JSM-7500F is highly sensitive, with an electron column that offers a maximum acceleration voltage of 30 kV, and a high-speed data acquisition equipment. The system offers a maximum of up to 60 images per second, and an image size of up to 2000 x 2000 pixels. It also has a high-speed X-ray mapping unit for accurate imaging of materials. Additionally, the machine is equipped with a high-precision computer-controlled sample stage for accurate sample position. JSM 7500F also has advanced analytical capabilities including EDS/EDX spectroscopy, which allows simultaneous spectroscopic analysis of a sample with high-resolution elemental mapping. It also allows energy dispersive X-ray imaging with an electron beam to acquire images based on the X-ray intensity. Moreover, JSM-7500F provides a high degree of automation, with image processing and analysis features that allow for manipulation and interpretation of acquired data. It is also equipped with EBSD measurement capabilities, which allow for the automatic mapping of crystalline structures and grain boundaries. In conclusion, JEOL JSM 7500F scanning electron microscope is a powerful and reliable tool for surface imaging and analysis of materials. With its powerful imaging and versatile analysis capabilities, it is ideal for laboratories or research facilities looking to analyze materials of varied complexities.