Used JEOL JSM 7500F #293643351 for sale

JEOL JSM 7500F is an advanced scanning electron microscope (SEM) used to examine the structures and surfaces of materials. This type of microscope works by emitting a focused beam of electrons onto a sample material, then collecting the electron signals that are bounced back from the sample. The microscope is used to observe both the composition and structure of a material with a high level of precision. JEOL JSM-7500F is equipped with four different electron optical lenses and is capable of high-resolution imaging. It is one of the highest-resolution SEMs on the market, reaching 1.3nm resolution at 15kV. The instrument also comes with a wide selection of detectors for various applications, including secondary and backscattered electron detectors, an EDX detector for elemental analysis, a cathodoluminescence (CL) detector, and a precise high acceleration voltage detector. The microscope is equipped with an automatic, high-speed stage that allows the sample holder to move and rotate in three axes. It also features a patented "Smart Eye" auto-focus system, which automates the focusing process, resulting in faster imaging and more accurate results. In addition, the microscope is capable of imaging samples in low vacuum operation, reducing the occurrence of charging effects and allowing for high-resolution imaging without the need for time-consuming sample coating. Furthermore, the microscope is equipped with an Auto Area Acquisition feature that automatically surveys a wide area of a sample in order to identify regions of interest for targeted imaging. The images collected can be manipulated with the software suite on board, allowing for easy analysis, preparation of comparative image sequences, and the integration of multiple images datasets. The system also is designed for ease of use, featuring a touchscreen control unit and a wide selection of preset operations that can be quickly accessed and executed by the user. JSM 7500F is an ideal tool for studying materials in both research and industrial applications.