Used JEOL JSM 7500F #9356461 for sale

JEOL JSM 7500F is an automatic scanning electron microscope (ASEM) that produces highly detailed images of biological and non-biological samples by scanning and detecting electron beams generated from a tungsten filament. It is designed for high performance imaging in multiple fields, including materials science, nanotechnology, medical science, and industrial metrology. JEOL JSM-7500F utilizes an array of advanced technologies, such as a field emission gun (FEG), digital signal processing (DSP), and an energy-filtering application (EFTEM) for high resolution imaging. It is based on a patented technology called aberration-corrected aberration-compensated (ACAC) technology, where the aberration caused by the objective lens of the electron microscope is corrected by applying the ACAC system. This results in significantly enhanced resolution of sample images. JSM 7500F is equipped with the advanced Digital Imaging and Analysis Open Platform (DIOP) software, which enables users to efficiently acquire and analyze high-resolution images of samples. Users have access to a range of imaging modes, such as SE (secondary electron), EDX (energy dispersive X-ray), EBIC (electron beam induced current), and EFTEM (energy-filtering transmission electron microscopy), as well as a suite of digital image processing functions. JSM-7500F is a highly durable instrument that is reliable and simple to operate. It has a curved PC and tiltable field emission gun (FEG) for easy access to the sample. It also features automated alignment, scanning and focusing functions that make it easier for users to obtain accurate results. JEOL JSM 7500F is ideal for users looking for a versatile, powerful, and high resolution imaging system. Its multiple imaging modes, high resolution, and robust image analysis capabilities make it suitable for a wide range of applications. It is capable of producing images that are both clear and detailed, allowing for a deeper inspection of samples. In conclusion, JEOL JSM-7500F is a high performance scanning electron microscope designed for use in a variety of fields. Its advanced technology allows for accurate and detailed imaging, and its automated functions make it easy to use. It is suitable for many types of research applications, from materials science to medical imaging.