Used JEOL JSM 7600F #293653209 for sale

Name: JEOL JSM 7600F
Brand: JEOL
SKU: 293653209
Availability: InStock

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Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 7600F

ID: 293653209

Vintage: 2009

Field Emission Scanning Electron Microscope (FE-SEM) EDAX Resolution: 1.0 nm at 15kV Accerlating voltage: 0.1 kV-30 kV Magnification range: 25x-19000x Prober current: 1 x 10^-13 order to ≥2x10^-7 A Electron optics: Conical anode gun (Schottky type, in-lens field emission) Probe current range: <1 pA to >200 nA Automatic gun isolation valve Adjustable OL aperture strip Scanning system: Digital scan generator system Digital scan rotation linked to kV and WD Computer eucentric tilt compensation Specimen chamber and stage Vacuum Chilller Detector: Electron detector, Backscatter electron detector Operating system: Windows 7 professional 2009 vintage.

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JEOL JSM 7600F is a scanning electron microscope (SEM) designed for maximum performance. It incorporates many advanced features and applications, enabling it to be used for a wide range of sample analysis. The microscope is highly versatile and can be used in both vacuum and environmental modes, making it ideal for a variety of research applications. JSM 7600F utilizes the latest in electron optics technology, providing excellent resolution and contrast. The electron optics design of JEOL JSM 7600F is based on a scanned fields of view. This scan pattern is used to allow the microscope to capture images at different focal depths and angles, resulting in more detailed, highly accurate images. The scan pattern also enables the microscope to generate digital images with improved contrast, resolution, and speed. JSM 7600F also includes a powerful energydispersive X-ray (EDX) spectrometer for sample analysis. The EDX spectrometer enables the microscope to detect and measure the difference in energy levels between elements, giving detailed sample elemental analysis. These readings can then be used to accurately identify the elements present in a sample. Additionally, the EDX spectrometer enables the user to measure and compare the concentration of elements in different regions of a sample. Additionally, JEOL JSM 7600F utilizes advanced software for image processing and analysis. This software gives the user the ability to easily manipulate and analyze images, generate 3D images, and produce data sets from a large number of images. The software also features automated features such as auto-focusing, automatic field of view, and automated specimen drift corrections. JSM 7600F is an extremely powerful, multifunctional instrument that is ideal for a variety of research applications. Its combination of advanced electron optics, EDX spectrometer, and software makes it a versatile and reliable tool for sample analysis. JEOL JSM 7600F is an essential instrument for any laboratory studying materials or conducting experiments.