Used JEOL JSM 7600F #293661547 for sale

JEOL JSM 7600F is a high resolution scanning electron microscope (SEM) designed for a wide range of applications including analytical and research applications. It has an advanced design and offers a wide range of features to meet even the most demanding needs. At the heart of JSM 7600F is its ultrahigh accelerating voltage potential, which is capable of providing a maximum of up to 30 kV for operation. This high accelerating voltage is essential for obtaining the high resolution and contrast levels necessary for high resolution imaging and analytical capabilities. The microscope also has an integrated design incorporating a high-performance field emission gun (FEG) and an imaging system with multiple detection pathways including secondary electron (SE) and back-scattered electron (BSE). This design enables the capture of a broad range of topographic and compositional structural information. In addition, JEOL JSM 7600F is equipped with an advanced scanning system that is capable of producing images with a lateral resolution of up to 2.5nm. This incredibly high resolution imaging capability is one of the key advantages of the microscope and is of great use in research applications such as in studies of low-to-medium-molecular-weight specimens, such as proteins, viruses, and bacteria. The microscope is also capable of producing images with high levels of contrast even at high magnifications, making it ideal for imaging very fine structures. This microscope also features a number of other features including a digital stage, motorized focusing, and automated source alignment capabilities. JSM 7600F is also equipped with automated digital controls which enable users to customize the microscope to best suit their applications. These digital controls include highspeed controls for scanning and analysis, as well as multiple image processing functions. The microscope also includes an automated beam deceleration system which helps protect the specimen against damage from the electron beam. Overall, JEOL JSM 7600F is an advanced and reliable scanning electron microscope that can be used to study and analyze various specimen types. It provides users with a wide range of features and capabilities, enabling them to obtain the highest resolution and contrast levels in their imaging and analysis.