Used JEOL JSM 7600F #9037223 for sale

JEOL JSM 7600F is a scanning electron microscope (SEM), used for imaging and analyzing the morphology of a variety of materials from biological to inorganic samples. The images and data generated by the 7600F provide very high resolution, providing valuable information to researchers, nanotechnologists and material designers. The 7600F is a field emission SEM, with a Berylium optical system that provides an ultra-high resolution of up to 0.2 nm with the help of auto focus electronics which helps automatically adjust focus to the target area. The system contains an Oxford INCA Energy™ Dispersive X-Ray (EDX) detector which allows the user to detect X-ray radiation emitted by the sample to identify the element composition. It provides high resolution imaging of even the smallest features on the sample. Additionally, JSM 7600F also features a high concurrency and fast processing capabilities, allowing it to image and process large data in a short time period. The on-board software allows maximum user control over SEM and EDX conditions for specimen preparation, magnification and contrast settings, etc. The device has a rigid and robust machine platform, which is built for continuous operation and increases the lifetime of the piece of equipment. The 7600F is well suited for a range of applications, from semiconductor analysis to nanoplotting, for a variety of samples including circuit boards, metal alloys, crystal structures and organic compounds. The resourceful device is also capable of automated site-survey and analysis, failure analysis, and tomography. JEOL JSM 7600F combines precision, rigor and high resolution to provide researchers and material designers with powerful imaging and analysis tools. With the advanced features and capabilities, the device is well-suited for a range of applications, making it an invaluable asset to research laboratories and engineering industries alike.