Used JEOL JSM 7600F #9285263 for sale

JEOL JSM 7600F is a high performance scanning electron microscope (SEM) that can be used to capture detailed structures and surfaces at a high resolution. It is equipped with a field emissions gun (FEG) electron source, which allows it to operate at greater acceleration voltages, higher current densities, and larger depth of field than most other SEMs. The microscope is designed to operate in ultra-high vacuum (UHV) conditions, making it ideal for imaging dielectric and organic samples. The microscope is equipped with a WDS (wavelength-dispersive spectroscopy) equipment, which allows it to identify and map elements on the sample surface. This system is capable of detecting elements such as phosphorus, sodium, aluminum, silicon, etc., and is used for material analysis. It also has an EBSD (electron backscatter diffraction) unit, which can determine the crystal structure of the sample. JSM 7600F is capable of producing high resolution images due to its highly sensitive detector machine. Its secondary and backscattered electron detectors, combined with its high resolution objective lens, are able to capture fractional-micron features on the sample. In addition, the microscope's EDX (energy-dispersive x-ray spectrometry) tool can be used to determine the composition of the sample. JEOL JSM 7600F is capable of various imaging modes, including SEM, TEM (transmission electron microscopy), and STEM (scanning transmission electron microscopy). The microscope is also equipped with an automated wafer stage, which allows for large-scale imaging over multiple surfaces. JSM 7600F has a large chamber which allows for large sample sizes, as well as automated sample transfer systems which can load samples easily and quickly. Finally, the microscope comes with a suite of advanced software, which allows users to control, monitor, and analyze images. This software is capable of creating 3D images from multiple SEM images and provides enhanced visualization and analysis tools.