Used JEOL JSM 7800F #293616742 for sale

JEOL JSM 7800F is a high performance scanning electron microscope (SEM) which combines unparalleled ultra-high resolution imaging with a range of powerful analytical capabilities. The advanced column architecture of JEOL JSM-7800F enables simultaneous imaging and analysis in all operated modes, delivering high resolution, high contrast imaging with low electron doses. The well designed operating controls and user-friendly graphical user interface (GUI) allow operators to get the most from the high resolution imaging of JSM 7800 F. Versatile draw functions, powerful automatic exposure control, and integrated chromatic and autofocus capabilities all contribute to ensuring success with demanding and challenging operations. JSM 7800F can be configured with a choice of detectors which allow the operator to choose the best system configuration for the intended application. Secondary electron (SE), backscattered electron (BSE), and in-lens (IL) detectors are available as standard options and time-of-flight (TOF) detectors can be added for elemental analysis. Additional detectors include a low angle detector for nanostructure analysis, a high angle detector for analyzing oxide surfaces, and a range of detectors for measuring specific elements. JEOL JSM 7800 F is designed to be incredibly versatile, covering a wide range of sample sizes, shapes, and materials. A wide range of sample holders allows optimal specimen loading and stable sample positioning. The exchangeable anode provides ultra-sharp microscopic resolution, ideal for studying microstructural features and nanoscale features. The in-column energy filter also adds flexibly in ensuring optimal image contrast. JSM-7800F also comes included with video viewfinding and digital imaging capabilities, enabling faster sample loading and computer-controlled scanning for precisely managed multi-stage analysis. JEOL JSM 7800F can also be integrated with a range of periphery equipment, such as film / cine cameras, laser scanning confocal microscopes, and scanning tunneling microscopes. Overall, JEOL JSM-7800F provides high resolution, ultra-fast scanning and sampling, and a wide range of versatility and flexibility. The advanced column architecture produces ultra-high resolution, low electron dose imaging, while the choice of detectors and exchangeable anode provides high quality imaging for a wide range of materials. Additionally, the GUI and integrated digital imaging capabilities allow for faster sample loading and computer-controlled operations for multi-stage analysis.