Used JEOL JSM-7800FLV #293664356 for sale
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ID: 293664356
Field Emission Scanning Electron Microscope (FE-SEM)
Type: Low vacuum
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JEOL JSM-7800FLV is a scanning electron microscope (SEM) designed for superior microscopy imaging and performance. It is a reliable and accurate tool for researching microstructures, offering the highest resolution and magnification capabilities to date. The equipment has a large 70 mm chamber made from Electro-Glas ceramic, allowing for high resolution viewing of objects from the nano-scale to the macro-scale. This is further enhanced by the incorporation of a field emission electron source which provides extremely bright and stable electron beams, allowing for more accurate results. Additionally, the integrated anti-vibration system adds an extra degree of stability and minimizes the possibility of errors. The SEM also has a robust array of imaging tools, allowing users to visualize their samples with the utmost accuracy and detail. It includes an advanced optical imaging unit with STEM (Scanning Transmission Electron Microscopy) and EDX (energy dispersive X-ray) technologies for unmatched 3-dimensional imaging. The STEM capabilities provide users with the ability to study sample components on the atomic level, while the EDX features allow for elemental analysis and associated concentration information. For convenience, JSM-7800FLV also comes with a fully automated specimen transfer machine which is both easy-to-use and reliable. This eliminates the need for costly manual processes and allows the user to focus on the creative aspects of conducting research. Overall, JEOL JSM-7800FLV is an efficient, versatile, and reliable scanning electron microscope. Its advanced optical imaging capabilities and automated tool provide users with superior imaging performance and the ability to analyze their samples with precision and accuracy. This makes the SEM an ideal tool for research activities of all kinds, from materials science to biomedical applications.
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